A Study on Insuring the Full Reliability of Finite State Machine

Yang Sun-Woong; Kim Moon-Joon; Park Jae-Heung; Chang Hoon

A Study on Insuring the Full Reliability of Finite State Machine

Yang Sun-Woong, Kim Moon-Joon, Park Jae-Heung, Chang Hoon, Journal of Internet Computing and Services, Vol. 4, No. 3, pp. 31-38, Jun. 2003
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Keywords: FSM, DFT, Non-Scan, Reliability

Abstract

In this paper, an efficient non-scan design-for-testability (DFT) method for finite state machine(FSM) is proposed. The proposed method always guarantees short test pattern generation time and complete fault efficiency. It has a lower area overhead than full-scan and other non-scan DFT methods and enables to apply test patterns at-speed. The efficiency of the proposed method is demonstrated using well-known MCNC'91 FSM benchmark circuits.

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Cite this article

[APA Style]

Sun-Woong, Y., Moon-Joon, K., Jae-Heung, P., & Hoon, C. (2003). A Study on Insuring the Full Reliability of Finite State Machine. Journal of Internet Computing and Services, 4(3), 31-38.

[IEEE Style]

Y. Sun-Woong, K. Moon-Joon, P. Jae-Heung, C. Hoon, "A Study on Insuring the Full Reliability of Finite State Machine," Journal of Internet Computing and Services, vol. 4, no. 3, pp. 31-38, 2003.

[ACM Style]

Yang Sun-Woong, Kim Moon-Joon, Park Jae-Heung, and Chang Hoon. 2003. A Study on Insuring the Full Reliability of Finite State Machine. Journal of Internet Computing and Services, 4, 3, (2003), 31-38.