Digital Library
Search: "[ keyword: OS ]" (128)
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Sanghoon Lee, Seung-Jin Moon, Vol. 15, No. 5, pp. 63-72, Oct. 2014
10.7472/jksii.2014.15.5.63
Keywords: Twitter trending topics, Automatic summary system, Fuzzy theory, HBase, NoSQL, Twitter API -
Yong-Beom Kim, Jeongho Kwak, Vol. 15, No. 4, pp. 67-80, Aug. 2014
10.7472/jksii.2014.15.4.67
Keywords: Smart Convergence, ICT Ecosystem, Creative Economy, ICT Policy -
73. Complexity Reduction of Blind Algorithms based on Cross-Information Potential and Delta FunctionsNamyong Kim, Vol. 15, No. 3, pp. 71-78, Jun. 2014
10.7472/jksii.2014.15.3.71
Keywords: cross-information potential, Dirac-delta, computational complexity, Impulsive noise, CIPD -
Dong-Il Cho, Vol. 15, No. 1, pp. 45-54, Feb. 2014
10.7472/jksii.2014.15.1.45
Keywords: UI-Mashup, Enterprise Portal, service composition -
Woonggi Kim, Junchul Chun, Vol. 14, No. 6, pp. 117-124, Dec. 2013
10.7472/jksii.2013.14.6.117
Keywords: Face Detection, Skin Color, Haar-like feature, Adaboost, optical flow, Template matching, Face pose estimation -
Myoungjin Kim, Seungho Han, Yun Cui, Hanku Lee, Vol. 14, No. 6, pp. 71-84, Dec. 2013
10.7472/jksii.2013.14.6.71
Keywords: Cloud computing, NoSQL, MongoDB, Unstructured Data, Banking System -
77. Implementation of parallel blocked LU decomposition program for utilizing cache memory on GP-GPUsYoungtae Kim, Doo-Han Kim, Myoung-Han Yu, Vol. 14, No. 6, pp. 41-48, Dec. 2013
10.7472/jksii.2013.14.6.41
Keywords: LU decomposition, GP-GPU, Nvidia CUDA, Parallel program -
Sungjoo Park, Kwanghoon Pio Kim, Vol. 14, No. 5, pp. 77-86, Oct. 2013
10.7472/jksii.2013.14.5.77
Keywords: Workflow, Social Network, Workflow-supported Social Network, Closeness Centrality -
Min Gyun Park, Piao Zhen Zhe, Hyun Jung La, Vol. 14, No. 2, pp. 73-0, Apr. 2013
10.7472/jksii.2013.14.2.73
Keywords: Mobile Cloud Computing, Static Offloading, Dynamic Offloading, Full Offloading, Partial Offloading, CostModel -
Hankyoung Kim, Vol. 14, No. 1, pp. 23-30, Feb. 2013
10.7472/jksii.2013.14.23
Keywords: Software Test, Test Point, Test Effort, Test Cost




