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1. Development of deep learning network based low-quality image enhancement techniques for improving foreign object detection performance

Ki-Yeol Eom, Byeong-Seok Min, Vol. 25, No. 1, pp. 99-107, Feb. 2024
10.7472/jksii.2024.25.1.99
Keywords: Foreign material; detection; Super resolution, X-ray, deep-learning